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Characterizing the impact of process variation on 45 nm NoC-based CMPsC. Hernández; A. Roca; J. Flich; F. Silla; J. Duato · 2011
[ACM Press the 42nd Annual IEEE/ACM International Symposium - New York, New York (2009.12.12-2009.12.16)] Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture - Micro-42 - Characterizing and mitigating the impact of process variations on phase change based memory systemsZhang, Wangyuan; Li, Tao · 2009
[ACM Press the ACM SIGMETRICS/international conference - Pittsburgh, PA, USA (2013.06.17-2013.06.21)] Proceedings of the ACM SIGMETRICS/international conference on Measurement and modeling of computer systems - SIGMETRICS '13 - Characterizing the impact of process variation on write endurance enhancing techniques for non-volatile memory systemsCintra, Marcelo; Linkewitsch, Niklas · 2013
ProphesyTaylor, Valerie; Wu, Xingfu; Stevens, Rick · ACM SIGMETRICS Performance Evaluation Review · 2003
A survey on cloud interoperabilityZhang, Zhizhong; Wu, Chuan; Cheung, David W.L. · ACM SIGMETRICS Performance Evaluation Review · 2013
Response Time PreservationAgrawal, Subhash C.; Buzen, Jeffrey P.; Shum, Annie W. · ACM SIGMETRICS Performance Evaluation Review · 1984
G-networksGelenbe, Erol · ACM SIGMETRICS Performance Evaluation Review · 1995
Bayesian probabilistic risk analysisMosleh, Ali; Hilton, E. Richard; Browne, Peter S. · ACM SIGMETRICS Performance Evaluation Review · 1985
PRISMKwiatkowska, Marta; Norman, Gethin; Parker, David · ACM SIGMETRICS Performance Evaluation Review · 2009
Estimating loss rates with TCPAllman, Mark; Eddy, Wesley M.; Ostermann, Shawn · ACM SIGMETRICS Performance Evaluation Review · 2003
An algorithm for sizing software productsDeMarco, Tom · ACM SIGMETRICS Performance Evaluation Review · 1984