![ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - (Invited) Electric-Field and Thermally-Activated Failure Mechanisms of AlGaN/GaN High Electron Mobility Transistors]()
ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - (Invited) Electric-Field and Thermally-Activated Failure Mechanisms of AlGaN/GaN High Electron Mobility TransistorsZanoni, Enrico; Meneghesso, Gaudenzio; Meneghini, Matteo; Stocco, Antonio; Rampazzo, Fabiana; Silvestri, Riccardo; Rossetto, Isabella; Ronchi, Nicolò · 2011