![SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology - The influence of thermal treatment on the passivation of SiN
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film and the dark current of p-i-n InGaAs detector]()
SPIE Proceedings [SPIE Applied Optics and Photonics China (AOPC2015) - Beijing, China (Tuesday 5 May 2015)] AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology - The influence of thermal treatment on the passivation of SiN
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film and the dark current of p-i-n InGaAs detectorGong, Haimei; Wu, Nanjian; Ni, Yang; Chen, Weibiao; Lu, Jin; Cao, Gaoqi; Tang, Hengjing; Shao, Xiumei; Wang, Rui; Li, Qingfa; Cheng, Jifeng; Li, Tao; Li, Xue; Gong, Haimei · 2015