International Encyclopedia of the Social & Behavioral Sciences || Objectivity, History of
- 作者Gaukroger, S.
- 文件大小70.92KB
- 发表时间2001
- DOI10.1016/b0-08-043076-7/03152-1
- 页码10785-10789
Electrical properties of hydrogen bombarded silicon surfacesA. Barhdadi; J.P. Ponpon; A. Grob; J.J. Grob; A. Mesli; J.C. Müller; P. Siffert · 1986
Recoil implantation of antimony into siliconA. Grob; J.J. Grob; N. Mesli; D. Salles; P. Siffert · 1981
Dynamics of lattice damage accumulation for MeV ions in siliconA. Golanski; A. Grob; J.J. Grob; O.W. Holland; S.J. Pennycook; C.W. White · 1992
Rapid thermal annealing and titanium silicide formationD. Levy; J. P. Ponpon; A. Grob; J. J. Grob; R. Stuck · 1985
Formation of palladium silicide by rapid thermal annealingD. Levy; A. Grob; J. J. Grob; J. P. Ponpon · 1984
Damage created in silicon by BFn+ (1≤ n ≤ 3) and PFn+ (1⪯ n:≤ 5) implantationsA. Grob; J.J. Grob; A. Golanski · 1987
Overcoming background contamination in closed loop stripping analysis (CLSA)K. Grob; G. Grob; A. Habich · 1984
A dechanneling investigation of MeV oxygen implanted siliconA. Grob; J.J. Grob; P. Thévenin; P. Siffert · 1991