RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage
- 作者M.B. Santos; F.M. Gonçalves; I.C. Teixeira; J.P. Teixeira
- 卷第18卷
- 期第2期
- 印刷ISSN0923-8174
- 电子ISSN1573-0727
- 文件大小308.20KB
- 发表时间2002-04
- DOI10.1023/a:1014997610714
- 页码179-187
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