![Analytical investigation of random grain boundaries of Zr-doped sintered α-Al
<sub/>2</sub>
O
<sub/>3</sub>
by transmission electron microscopy and scanning transmission electron microscopy]()
Analytical investigation of random grain boundaries of Zr-doped sintered α-Al
<sub/>2</sub>
O
<sub/>3</sub>
by transmission electron microscopy and scanning transmission electron microscopyKaneko, K.; Gemming, T.; Tanaka, I.; Müllejans, H. · Philosophical Magazine A · 1998