![[ASME ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Atlanta, Georgia, USA (Saturday 3 March 2012)] ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Thermoelectric Characterization of Ge
<sub/>2</sub>
Sb
<sub/>2</sub>
Te
<sub/>5</sub>
Films for Phase-Change Memory]()
[ASME ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Atlanta, Georgia, USA (Saturday 3 March 2012)] ASME 2012 Third International Conference on Micro/Nanoscale Heat and Mass Transfer - Thermoelectric Characterization of Ge
<sub/>2</sub>
Sb
<sub/>2</sub>
Te
<sub/>5</sub>
Films for Phase-Change MemoryLee, Jaeho; Kodama, Takashi; Won, Yoonjin; Asheghi, Mehdi; Goodson, Kenneth E. · 2012