![[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Analog/RF test ordering in the early stages of production testing]()
[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Analog/RF test ordering in the early stages of production testingAkkouche, Nourredine; Mir, Salvador; Simeu, Emmanuel; Slamani, Mustapha · 2012