![[IEEE 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2016.11.13-2016.11.16)] 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Scaling and traps induced degradation of cutoff frequency in GaN HEMT]()
[IEEE 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2016.11.13-2016.11.16)] 2016 11th International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Scaling and traps induced degradation of cutoff frequency in GaN HEMTUbochi, B. C.; Faramehr, S.; Ahmeda, K.; Igic, P.; Kalna, K. · 2016