[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Microscopic origin of random telegraph noise fluctuations in aggressively scaled RRAM and its impact on read disturb variabilityRaghavan, N.; Degraeve, R.; Fantini, A.; Goux, L.; Strangio, S.; Govoreanu, B.; Wouters, D. J.; Groeseneken, G.; Jurczak, M. · 2013

[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hourglass concept for RRAM: A dynamic and statistical device modelDegraeve, R.; Fantini, A.; Raghavan, N.; Goux, L.; Clima, S.; Chen, Y. Y.; Belmonte, A.; Cosemans, S.; Govoreanu, B.; Wouters, D. J.; Roussel, Ph.; Kar, G. S.; Groeseneken, G.; Jurczak, M. · 2014