[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - TSV-to-TSV inductive coupling-aware coding scheme for 3D Network-on-Chip
- 作者Eghbal, Ashkan; Yaghini, Pooria M.; Yazdi, Siavash S.; Bagherzadeh, Nader
- 文件大小1106.26KB
- 发表时间2014
- DOI10.1109/DFT.2014.6962067
- 页码92-97
[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - [Front matter]2014
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[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Rescuing healthy cores against disabled routersEbrahimi, Masoumeh; Wang, Junshi; Huang, Letian; Daneshtalab, Masoud; Jantsch, Axel · 2014
[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Estimating the effect of single-event upsets on microprocessorsConstantinescu, Cristian; Krishnamoorthy, Srini; Nguyen, Tuyen · 2014
[IEEE 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Amsterdam, Netherlands (2014.10.1-2014.10.3)] 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Characterization of data retention faults in DRAM devicesBacchini, Angelo; Rovatti, Marco; Furano, Gianluca; Ottavi, Marco · 2014