![[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panels]()
[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - ATR-FTIR, DUAL BEAM FIB-SEM, TEM and TOF-SIMS studies on high temperature and moisture induced “white haze” following the pattern of electrodes in touch panelsYixin, Chen; Meng, Hao; Jingjing, Shao; Esther, Lee; Sheng, Khoo Bing; Meailing, Chooi; Kai, Li; Qiuju, Xin; Cambridge, Kon; Sheng, Lee Hwang; Yiqiang, Shen; Lu, Song; Zhenxiang, Xing; Yongkai, Zhou; Yang, Feng; Chao, Fu; Younan, Hua; Xiaomin, Li · 2014