Ubiquity symposium: The science in computer science: unplugging computer science to find the science
- 期刊名称Ubiquity
- 作者Bell, Tim
- 卷第2014卷
- 电子ISSN1530-2180
- 文件大小1672.56KB
- 发表时间2014-03-01
- DOI10.1145/2590528.2590531
- 页码1-6
Characterizing the impact of process variation on 45 nm NoC-based CMPsC. Hernández; A. Roca; J. Flich; F. Silla; J. Duato · 2011
[ACM Press the 42nd Annual IEEE/ACM International Symposium - New York, New York (2009.12.12-2009.12.16)] Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture - Micro-42 - Characterizing and mitigating the impact of process variations on phase change based memory systemsZhang, Wangyuan; Li, Tao · 2009
[ACM Press the ACM SIGMETRICS/international conference - Pittsburgh, PA, USA (2013.06.17-2013.06.21)] Proceedings of the ACM SIGMETRICS/international conference on Measurement and modeling of computer systems - SIGMETRICS '13 - Characterizing the impact of process variation on write endurance enhancing techniques for non-volatile memory systemsCintra, Marcelo; Linkewitsch, Niklas · 2013
ProphesyTaylor, Valerie; Wu, Xingfu; Stevens, Rick · ACM SIGMETRICS Performance Evaluation Review · 2003
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Response Time PreservationAgrawal, Subhash C.; Buzen, Jeffrey P.; Shum, Annie W. · ACM SIGMETRICS Performance Evaluation Review · 1984
G-networksGelenbe, Erol · ACM SIGMETRICS Performance Evaluation Review · 1995
Bayesian probabilistic risk analysisMosleh, Ali; Hilton, E. Richard; Browne, Peter S. · ACM SIGMETRICS Performance Evaluation Review · 1985
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An algorithm for sizing software productsDeMarco, Tom · ACM SIGMETRICS Performance Evaluation Review · 1984