SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 13 February 2016)] Gallium Nitride Materials and Devices XI - Exciton localization in (11-22)-oriented semi-polar InGaN multiple quantum wells
- 作者Chyi, Jen-Inn; Fujioka, Hiroshi; Morkoç, Hadis; Monavarian, Morteza; Rosales, Daniel; Gil, Bernard; Izyumskaya, Natalia; Das, Saikat; Özgür, Ümit; Morkoç, Hadis; Avrutin, Vitaliy
- 卷第9748卷
- 印刷ISSN0277-786X
- 文件大小464.05KB
- 发表时间2016
- DOI10.1117/12.2213835
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Front Matter: Volume 8789SPIE, Proceedings of; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Diffractive optical element for optical data storageYoshida, S.; Unno, N.; Akamatsu, H.; Yamada, K.; Taniguchi, J.; Yamamoto, M.; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Investigation of microstructured fiber geometries by scatterometryHansen, Poul-Erik; Burger, Sven; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Defect parameters retrieval based on optical projection imagesXu, Dongbo; Li, Sikun; Wang, Xiangzhao; Fühner, Tim; Erdmann, Andreas; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Mueller matrix characterization using spectral reflectometryShafir, Dror; Barak, Gilad; Yachini, Michal H.; Sendelbach, Matthew; Bozdog, Cornel; Wolfling, Shay; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Modelling PTB's spatial angle autocollimator calibratorKranz, Oliver; Geckeler, Ralf D.; Just, Andreas; Krause, Michael; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - A new method for adjusting the lateral transfer hollow retroreflectorErshov, Alexandr G.; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Alternative methods for uncertainty evaluation in EUV scatterometryHeidenreich, Sebastian; Henn, Mark-Alexander; Gross, Hermann; Bodermann, Bernd; Bär, Markus; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013