SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California, United States (Saturday 13 February 2016)] Oxide-based Materials and Devices VII - Structural, magnetic and Magneto optical properties of Fe 3 O 4 /NiO bilayers on MgO(001)
- 作者Teherani, Ferechteh H.; Look, David C.; Rogers, David J.; Wollschläger, Joachim; Schemme, Tobias; Kuschel, Olga; Witziok, Matthäus; Kuschel, Timo; Kuepper, Karsten
- 卷第9749卷
- 印刷ISSN0277-786X
- 文件大小880.25KB
- 发表时间2016
- DOI10.1117/12.2219627
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Front Matter: Volume 8789SPIE, Proceedings of; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Diffractive optical element for optical data storageYoshida, S.; Unno, N.; Akamatsu, H.; Yamada, K.; Taniguchi, J.; Yamamoto, M.; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Defect parameters retrieval based on optical projection imagesXu, Dongbo; Li, Sikun; Wang, Xiangzhao; Fühner, Tim; Erdmann, Andreas; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
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SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - A new method for adjusting the lateral transfer hollow retroreflectorErshov, Alexandr G.; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Alternative methods for uncertainty evaluation in EUV scatterometryHeidenreich, Sebastian; Henn, Mark-Alexander; Gross, Hermann; Bodermann, Bernd; Bär, Markus; Bodermann, Bernd; Frenner, Karsten; Silver, Richard M. · 2013