Register File Criticality and Compiler Optimization Effects on Embedded Microprocessors Reliability
- 期刊名称IEEE Transactions on Nuclear Science
- 作者Lins, Filipe; Tambara, Lucas; Lima Kastensmidt, Fernanda; Rech, Paolo
- 印刷ISSN0018-9499
- 电子ISSN1558-1578
- 文件大小290.82KB
- 发表时间2017
- DOI10.1109/TNS.2017.2705150
- 页码1-1
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