Thermal stress probing the channel-length modulation effect of nano n-type FinFETs
- 期刊名称Microelectronics Reliability
- 作者Tuan, Fu-Yuan; Chen, Chii-Wen; Wang, Mu-Chun; Liao, Wen-Shiang; Wang, Shea-Jue; Fan, Shou-Kong; Lan, Wen-How
- 印刷ISSN0026-2714
- 文件大小3689.51KB
- 发表时间2017-7
- DOI10.1016/j.microrel.2017.06.067
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