汽车使用性能与检测
- 作者李兴卫主编；李子路，孙洁，刘升副主编
- 出版社成都：西南交通大学出版社
- 标注页数273 页
- 文件页数279 页
- 文件大小134.25 MB
- 出版时间2016
- ISBN7564350895
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - A 38 GHz Horn Antenna ArraySehm, T.; Lehto, A.; Raisanen, A. V. · 1998
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - A Low Spurious Direct Digital SynthesiserSutciffe, R J; Parkinson, G · 1998
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - GaAs a key RF technology - Industrialisation & competitionPettenpaul, E. · 1998
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - A new LMDS Architecture based on TLNCelidonio, Massimo · 1998
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - Design of a Multifrequency FMCW RadarJankiraman, M.; Wessels, B.J.; van Genderen, P. · 1998
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - A Novel Linear-Circular Polarization ConverterPilz, Dietmar; Menzel, Wolfgang · 1998
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - Design Aspects of a GSM Card PhoneLunden, O.-P.; Talvitie, O.; Nokkonen, U. · 1998
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - A Monolithic Temperature Compensated 1.6 GHZ VCOStadius, Kari; Holmberg, Jan; Kaunisto, Risto; Alinikula, Petteri; Porra, Veikko · 1998
Characteristic impedance extraction using calibration comparisonVandenberghe, S.; Schreurs, D.M.M.-P.; Carchon, G.; Nauwelaers, B.K.J.C.; De Raedt, W. · 2001
[IEEE 57th ARFTG Conference Digest - Phoenix, AZ, USA (2001.05.25-2001.05.25)] 57th ARFTG Conference Digest - Characteristic Impedance Extraction Using Calibration ComparisonVandenberghe, S.; Schreurs, D.; Carchon, G.; Nauwelaers, B.; de Raedt, W. · 2001
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - Compensating Differences Between Measurement and Calibation Wafer in Probe Tip Calibrations - Deembedding of Line ParametersCarchon, G.; Schreurs, D.; Vandenberghe, S.; Nauwelaers, B.; De Raedt, W. · 1998
[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Identifying error-box parameters from the twelve-term vector network analyzer error modelVandenberghe, S.; Schreurs, D.; Carchon, G.; Nauwelaers, B.; De Raedt, W. · 2002