X-ray diffraction study of Si(111)√3 × √3-AuY. Kuwahara; S. Nakatani; M. Takahasi; M. Aono; T. Takahashi · 1994

X-ray reflectivity for the complete determination of surface structuresT. Takahashi; S. Nakatani · 1996

Interface reconstructed structure of Ag/Si(1 1 1) revealed by X-ray diffractionS. Horii; K. Akimoto; S. Ito; T. Emoto; A. Ichimiya; H. Tajiri; W. Yashiro; S. Nakatani; T. Takahashi; H. Sugiyama; X. Zhang; H. Kawata · 2001

Characterization of amorphous-Si/1ML-Ge/Si(001) Interface Structure by X-ray Standing WavesS. Nakatani; K. Sumitani; A. Nojima; T. Takahashi; K. Hirano; S. Koh; T. Irisawa; Y. Shiraki · 2003

Surface X-ray diffraction study on the Si(001)2 × 1 structureM. Takahasi; S. Nakatani; Y. Ito; T. Takahashi; X.W. Zhang; M. Ando · 1995

Structure determination of Si(111)3 × 3Sb surface by X-ray diffractionS. Nakatani; Y. Kuwahara; T. Takahashi; M. Aono · 1996

Refinement of the Si(111)√3 × √3-Ag structure by surface X-ray diffractionT. Takahashi; S. Nakatani · 1993