One line decreases the visibility of a simultaneous identical distant second line
- 作者Donald L. King; Jacqueline F. Mose; Nikola S. Nixon
- 卷第57卷
- 期第3期
- 印刷ISSN0031-5117
- 电子ISSN1532-5962
- 文件大小1191.61KB
- 发表时间1995-04
- DOI10.3758/bf03213063
- 页码393-401
On the physics of metal-semiconductor interfacesMonch, W · Reports on Progress in Physics · 1990
A Testbed for Simulating Semiconductor Supply ChainsEwen, Hanna; Monch, Lars; Ehm, Hans; Ponsignon, Thomas; Fowler, John W.; Forstner, Lisa · IEEE Transactions on Semiconductor Manufacturing · 2017
Low-energy electron diffraction from Si(111)-2×1: theory and experimentFeder, R; Monch, W; Auer, P P · Journal of Physics C: Solid State Physics · 1979
Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devicesBruckner, W.; Baunack, S.; Hecker, M.; Monch, J.-I.; van Loyen, L.; Schneider, C. M. · 2000
Modelling and analysis of semiconductor manufacturing in a shrinking world: challenges and successesChien, Chen Fu; Peres, Stephane Dauzere; Ehm, Hans; Fowler, John W.; Jiang, Zhibin; Krishnaswamy, Shekar; Lee, Tae Eog; Monch, Lars; Uzsoy, Reha · European J. of Industrial Engineering · 2011
Effects of third-element additions on the superconducting properties of bronze-processed V3Ga wiresFischer, K.; Rohr, S.; Monch, J.; Holzhauser, W.; Lange, F. · 1981
Erratum: “Interdiffusion in NiFe/Cu/NiFe trilayers: Possible failure mechanism for magnetoelectronic devices” [Appl. Phys. Lett. 77, 358 (2000)]Brückner, W.; Baunack, S.; Hecker, M.; Monch, J.-I.; van Loyen, L.; Schneider, C. M. · Applied Physics Letters · 2000
IndexApplied Surface Science · 2001
IndexApplied Surface Science · 2001
PrefaceNakayama, Katsuya; Yoshimori, Akio; Murata, Yoshitada · Applied Surface Science · 2001
Cluster generation by laser ablationSaito, Naoaki; Koyama, Kazuyoshi; Tanimoto, Mitsumori · Applied Surface Science · 2001
KEKB vacuum systemKanazawa, K.; Kato, S.; Suetsugu, Y.; Hisamatsu, H.; Shimamoto, M.; Sato, M.; Shirai, M. · Applied Surface Science · 2001
Editorial BoardApplied Surface Science · 2012
Editorial BoardApplied Surface Science · 2012
Editorial BoardApplied Surface Science · 2012