海量图书期刊资源,随时随地畅享阅读乐趣
Stress-induced high-field gate leakage current in ultra-thin gate oxideJianlin Wei; Lingfeng Mao; Mingzhen Xu; Changhua Tan; Xiaorong Duan · 2000
Numerical analysis for the effects of interface roughness on the attenuation amplitudes of Fowler–Nordheim tunneling current oscillations in ultrathin MOSFETsLingfeng Mao; Heqiu Zhang; Jianlin Wei; Fuchen Mu; Changhua Tan; Mingzhen Xu · 2001
An improved method for determining the critical energy for interface trap generation of n-MOSFETs under Vg=Vd/2 stress modeFuchen Mu; Lingfeng Mao; Jianlin Wei; Changhua Tan; Mingzhen Xu · 2001