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Electrical characterisation of NiO/ZnO structuresF. D. Auret; L. Wu; W. E. Meyer; J. M. Nel; M. J. Legodi; M. Hayes · 2004
Electrical characterization of He+ irradiated n-ZnOM. Hayes; F. D. Auret; P. J. Janse van Rensburg; J. M. Nel; W. Wesch; E. Wendler · 2007
Damage formation in Ge during Ar+ implantation at 15 KM. Hayes; A. Schroeter; E. Wendler; W. Wesch; F. D. Auret; J. M. Nel · 2008
The effect of etching on Ge(111) surfaces and Pd Schottky contactsJ. M. Nel; T. C. Griffiths; L. van Schalkwyk; F. D. Auret; M. Hayes; N. van den Berg · 2008
Electrical characterization of defects introduced in Ge during electron beam deposition of different metalsF. D. Auret; S. M. M. Coelho; M. Hayes; W. E. Meyer; J. M. Nel · 2008
Electrical characterization of defects introduced in n-type Ge during indium implantationF. D. Auret; P. J. Janse Van Rensburg; M. Hayes; J. M. Nel; W. E. Meyer; S. Decoster; V. Matias; A. Vantomme · 2006
IV and CV measurements of Schottky diodes deposited on Ge by electron beam and sputter depositionS. M. M. Coelho; F. D. Auret; P. J. Janse van Rensberg; C. Nyamhere; J. M. Nel; M. Hayes · 2008