[Engineering Materials and Processes] Microbiologically Influenced Corrosion || Microbiologically Influenced Corrosion (MIC)
- 作者Javaherdashti, Reza
- 文件大小1907.48KB
- 发表时间2017
- DOI10.1007/978-3-319-44306-5_4
- 页码29-79
[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscopy for Two-Dimensional MaterialsHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy ||Hlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || IonoluminescenceHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Channeling and Backscatter ImagingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscope Fabrication of Solid-State Nanopore Devices for Biomolecule AnalysisHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm ScaleHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Monte Carlo Simulations of Focused Ion Beam Induced ProcessingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Introduction to Imaging Techniques in the HIMHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy ||Hlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || IonoluminescenceHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Channeling and Backscatter ImagingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Introduction to Imaging Techniques in the HIMHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Helium Ion Microscopy for Two-Dimensional MaterialsHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Direct–Write Milling and Deposition with Noble GasesHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Monte Carlo Simulations of Focused Ion Beam Induced ProcessingHlawacek, Gregor; Gölzhäuser, Armin · 2016
[NanoScience and Technology] Helium Ion Microscopy || Structural Changes in 2D Materials Due to Scattering of Light IonsHlawacek, Gregor; Gölzhäuser, Armin · 2016