![[IEEE 2015 International Semiconductor Conference (CAS) - Sinaia, Romania (2015.10.12-2015.10.14)] 2015 International Semiconductor Conference (CAS) - SiO2/4H-SiC interface states reduction by POCl3 post-oxidation annealing]()
[IEEE 2015 International Semiconductor Conference (CAS) - Sinaia, Romania (2015.10.12-2015.10.14)] 2015 International Semiconductor Conference (CAS) - SiO2/4H-SiC interface states reduction by POCl3 post-oxidation annealingPascu, Razvan; Craciunoiu, Florea; Kusko, Mihaela; Mihaila, Mihai; Pristavu, Gheorghe; Badila, Marian; Brezeanu, Gheorghe · 2015