C*代数入门 英文
- 作者（美）艾文森著
- 出版社世界图书广东出版公司
- 标注页数106 页
- 文件大小34.17 MB
- 出版时间2009
- ISBN9787510005060
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Optimal interconnect diagnosisShi, W.; Fuchs, W.K. · 1993
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Test sequence algorithms and formal languagesvan de Burgt, S.P. · 1993
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A global BIST methodologyGheewala, T.; Sucar, H.; Varma, P. · 1993
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Reliable fail-safe systemsLubaszewski, M.; Courtois, B. · 1993
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Universal test set generation for CMOS circuitsChen, B.; Lee, C.L. · 1993
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - Parallel computation of LFSR signaturesNarendran, B.; Franklin, M.; Saluja, K.K. · 1993
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A new method for system diagnosisXu, S.; Gao, J. · 1993
[IEEE Comput. Soc. Press 1993 IEEE 2nd Asian Test Symposium (ATS) - Beijing, China (16-18 Nov. 1993)] Proceedings of 1993 IEEE 2nd Asian Test Symposium (ATS) - A 15-valued fast test generation for combinational circuitsHong, S.J. · 1993