![[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - BIST technique by equally spaced test vector sequences]()
[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - BIST technique by equally spaced test vector sequencesManich, S.; Garcia, L.; Balado, L.; Lupon, E.; Rius, J.; Rodriguez, R.; Figueras, J. · 2004