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[ASME ASME 2013 Conference on Frontiers in Medical Devices: Applications of Computer Modeling and Simulation - Washington, DC, USA (Wednesday 11 September 2013)] ASME 2013 Conference on Frontiers in Medical Devices: Applications of Computer Modeling and Simulation - Investigation of the Effect of Stent Length and Stent Location on the Deformation Characteristics of the Femoropopliteal Artery After Knee Flexion: A Finite Element StudyNí Ghriallais, Ríona; Bruzzi, Mark · 2013
[ASME ASME 2013 Summer Bioengineering Conference - Sunriver, Oregon, USA (Wednesday 26 June 2013)] Volume 1B: Extremity; Fluid Mechanics; Gait; Growth, Remodeling, and Repair; Heart Valves; Injury Biomechanics; Mechanotransduction and Sub-Cellular Biophysics; MultiScale Biotransport; Muscle, Tendon and Ligament; Musculoskeletal Devices; Multiscale Mechanics; Thermal Medicine; Ocular Biomechanics; Pediatric Hemodynamics; Pericellular Phenomena; Tissue Mechanics; Biotransport Design and Devices; Spine; Stent Device Hemodynamics; Vascular Solid Mechanics; Student Paper and Design Competitions - Simulating the Effects of Embolic Coils on Cerebral Aneurysm Fluid Dynamics Using Finite Element ModelingBabiker, M. H.; Gonzalez, L. F.; Chong, B.; Frakes, D. H. · 2013
Band Offsets in Dielectric/InGaZnO4 HeterojunctionsCho, H.; Kim, K.-W.; Douglas, E. A.; Gila, B. P.; Craciun, V.; Lambers, E. S.; Norton, D. P.; Ren, F.; Pearton, S. J. · ECS Transactions · 2013
Band Offsets in YSZ/InGaZnO4 Heterostructure SystemKim, J. K.; Kim, K.-W.; Douglas, E. A.; Gila, B. P.; Craciun, V.; Lambers, E. S.; Norton, D. P.; Ren, F.; Pearton, S. J.; Cho, Hyun · Journal of Nanoscience and Nanotechnology · 2014
GaN High Electron Mobility Transistor Degradation: Effect of RF StressDouglas, E. A.; Gila, B. P.; Abernathy, C. R.; Ren, F.; Pearton, S. J. · ECS Transactions · 2013
Low-voltage indium gallium zinc oxide thin film transistors on paper substratesLim, Wantae; Douglas, E. A.; Norton, D. P.; Pearton, S. J.; Ren, F.; Heo, Young-Woo; Son, S. Y.; Yuh, J. H. · Applied Physics Letters · 2010
The Effects of Device Dimension, Substrate Temperature, and Gate Metallization on the Reliability of AlGaN/GaN High Electron Mobility TransistorsRen, F.; Pearton, S. J.; Liu, Lu; Kang, T.-S.; Douglas, E. A.; Chang, C. Y.; Lo, C.-F.; Cullen, D. A.; Zhou, L.; Smith, D. J. · MRS Proceedings · 2012
Improvement in bias stability of amorphous-InGaZnO[sub 4] thin film transistors with SiO[sub x] passivation layersLim, Wantae; Douglas, E. A.; Norton, D. P.; Pearton, S. J.; Ren, F.; Heo, Young-Woo; Son, S. Y.; Yuh, J. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2010
Electric-Field-Driven Degradation in off-State Step-Stressed AlGaN/GaN High-Electron Mobility TransistorsChang, Chih-Yang; Douglas, E. A.; Kim, Jinhyung; Lu, Liu; Lo, Chien-Fong; Chu, Byung-Hwan; Cheney, D. J.; Gila, B. P.; Ren, F.; Via, G. D.; Cullen, David A.; Zhou, Lin; Smith, David J.; Jang, Soohwan; Pearton, S. J. · IEEE Transactions on Device and Materials Reliability · 2011
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992