[IEEE 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM, USA (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - WiPDA 2017 sponsors2017

[IEEE 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM, USA (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Organizing Committee2017

[IEEE 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM, USA (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Technical program2017

[IEEE 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM, USA (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Author index2017

[IEEE 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM, USA (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - [Copyright notice]2017

[IEEE 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM, USA (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Panel discussion overview [2 abstracts]2017

[IEEE 2017 IEEE 5th Workshop on Wide-Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Protruding ceramic substrates for high voltage packaging of wide bandgap semiconductorsReynes, Hugo; Buttay, Cyril; Morel, Herve · 2017

[IEEE 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Albuquerque, NM, USA (2017.10.30-2017.11.1)] 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA) - Welcome from the general chair2017

A New Complete Condition Monitoring Method for SiC Power MOSFETsUgur, Enes; Xu, Chi; Yang, Fei; Pu, Shi; Akin, Bilal · IEEE Transactions on Industrial Electronics · 2020

Performance Degradation of GaN HEMTs Under Accelerated Power Cycling TestsXu, Chi; Yang, Fei; Ugur, Enes; Pu, Shi; Akin, Bilal · CPSS Transactions on Power Electronics and Applications · 2018

Degradation Assessment and Precursor Identification for SiC MOSFETs under High Temp CyclingUgur, Enes; Yang, Fei; Pu, Shi; Zhao, Shuai; Akin, Bilal · IEEE Transactions on Industry Applications · 2019

In-situ Degradation Monitoring of SiC MOSFET Based on Switching Transient MeasurementPu, Shi; Ugur, Enes; Yang, Fei; Wang, Gangyao; Akin, Bilal · IEEE Transactions on Industrial Electronics · 2019

A Practical On-board SiC MOSFET Condition Monitoring Technique for Aging DetectionPu, Shi; Yang, Fei; Vankayalapati, Bhanu; Ugur, Enes; Xu, Chi; Akin, Bilal · IEEE Transactions on Industry Applications · 2020

[IEEE 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - Detroit, MI, USA (2019.6.19-2019.6.21)] 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - SiC MOSFET Aging Detection Based on Miller Plateau Voltage SensingPu, Shi; Yang, Fei; Ugur, Enes; Xu, Chi; Akin, Bilal · 2019

[IEEE 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - Detroit, MI, USA (2019.6.19-2019.6.21)] 2019 IEEE Transportation Electrification Conference and Expo (ITEC) - On-Board SiC MOSFET Degradation Monitoring Through Readily Available Inverter Current/Voltage SensorsPu, Shi; Yang, Fei; Ugur, Enes; Vankayalapati, Bhanu Teja; Xu, Chi; Akin, Bilal · 2019

[IEEE 2018 IEEE Transportation Electrification Conference and Expo (ITEC) - Long Beach, CA, USA (2018.6.13-2018.6.15)] 2018 IEEE Transportation Electrification Conference and Expo (ITEC) - Design of a Fast Dynamic On-Resistance Measurement Circuit for GaN Power HEMTsYang, Fei; Xu, Chi; Ugur, Enes; Pu, Shi; Akin, Bilal · 2018