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[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Title page2010
Via wearout detection with on-chip monitorsFahad Ahmed; Linda Milor · 2010
Backend dielectric reliability simulator for microprocessor systemChang-Chih Chen; Fahad Ahmed; Dae Hyun Kim; Sung Kyu Lim; Linda Milor · 2012
Online Measurement of Degradation Due to Bias Temperature Instability in SRAMsAhmed, Fahad; Milor, Linda · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2015
Impact of NBTI/PBTIon SRAMs within microprocessor systems: Modeling, simulation, and analysisChen, Chang-Chih; Ahmed, Fahad; Milor, Linda · Microelectronics Reliability · 2013
[IEEE 2009 IEEE International Interconnect Technology Conference - IITC - Sapporo, Japan (2009.06.1-2009.06.3)] 2009 IEEE International Interconnect Technology Conference - On chip monitoring of via degradationAhmed, Fahad; Milor, Linda · 2009
[IEEE 2009 3rd International Workshop on Advances in sensors and Interfaces - Trani, Italy (2009.06.25-2009.06.26)] 2009 3rd International Workshop on Advances in sensors and Interfaces - Via wearout detection with on chip monitorsAhmed, Fahad; Milor, Linda · 2009
[IEEE 2009 IEEE International Conference on Computer Design (ICCD 2009) - Lake Tahoe, CA, USA (2009.10.4-2009.10.7)] 2009 IEEE International Conference on Computer Design - Reliable cache design with detection of gate oxide breakdown using BISTAhmed, Fahad; Milor, Linda · 2009
[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Ring oscillator based embedded structure for decoupling PMOS/NMOS degradation with switching activity replicationAhmed, Fahad; Milor, Linda · 2010