Broadside and Functional Broadside Tests for Partial-Scan Circuits
- 期刊名称IEEE Transactions on Very Large Scale Integration (VLSI) Systems
- 作者Pomeranz, Irith; Reddy, Sudhakar M.
- 卷第19卷
- 期第6期
- 印刷ISSN1063-8210
- 电子ISSN1557-9999
- 文件大小176.25KB
- 发表时间2011-06
- DOI10.1109/tvlsi.2010.2044049
- 页码1104-1108
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