Texture effects on design of Mg biodegradable stents
- 作者Maurizio Vedani, Qiang Ge, Wei Wu…
- 卷第7卷
- 期第1期
- 文件大小746.28KB
- 发表时间2014-03
- DOI10.1007/s12289-012-1108-5
- 页码31-38
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Keynote AddressFields, J. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - SOC test scheduling using simulated annealingWei Zou, ; Reddy, S.M.; Pomeranz, I.; Yu Huang, · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Test resource partitioning and optimization for SOC designsLarsson, E.; Fujiwara, H. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Development of energy consumption ratio testXiaoyun Sun, ; Kinney, L.; Vinnakota, B. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Fault testing for reversible circuitsPatel, K.N.; Hayes, J.P.; Markov, I.L. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Layered approach to designing system test interfacesMan Wah Chiang, ; Zilic, Z. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Testing SoC interconnects for signal integrity using boundary scanTehranipour, M.H.; Ahmed, N.; Nourani, M. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Deterministic test vector decompression in software using linear operations [SOC testing]Balakrishnan, K.J.; Touba, N.A. · 2003
Test set embedding for deterministic BIST using a reconfigurable interconnection networkLei Li; Chakrabarty, K. · 2004
[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Hybrid BIST Based on Repeating Sequences and Cluster AnalysisLei Li, ; Chakrabarty, K. · 2005