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Sample surface atomic resolution secondary electron imaging with an aberration corrected STEMInada, H.; Nakamura, K.; Tamura, K.; Suzuki, Y.; Sato, T.; Konno, M.; Su, D.; Wall, J.; Zhu, Y.; Ciston, J. · Microscopy and Microanalysis · 2012
Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron MicroscopeInada, H; Tamura, K; Nakamura, K; Suzuki, Y; Konno, M; Su, D; Wall, J; Egerton, R; Zhu, Y · Microscopy and Microanalysis · 2011
Application of 80-200 kV aberration corrected dedicated STEM with cold FEGKonno, M; Suzuki, Y; Inada, H; Nakamura, K · Journal of Physics: Conference Series · 2010
Application of Low Accelerating Voltage Aberration Corrected Dedicated STEM With Cold FEG.Konno, M; Suzuki, Y; Nakamura, K; Inada, H · Microscopy and Microanalysis · 2009
High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron MicroscopeKonno, M; Suzuki, Y; Inada, H; Nakamura, K; Kimoto, K; Zhu, Y · Microscopy and Microanalysis · 2010
Minimizing 6-fold Symmetry and Chromatic Aberration by Using Ultra High Resolution Lens in Cs-Corrected STEMNakamura, K; Inada, H; Konno, M; Suzuki, Y; Kimoto, K · Microscopy and Microanalysis · 2010
High Resolution Secondary-Electron and ADF-STEM Imaging with Hitachi HD2700C Scanning Transmission Electron MicroscopeInada, H; Konno, M; Suzuki, Y; Nakamura, K; Wall, J; Zhu, Y · Microscopy and Microanalysis · 2010
Image analysis and simulation software in transmission electron microscopyStadelmann, P · Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada · 2003
Surface Microanalysis with Slow ElectronsBauer, Ernst G. · Microscopy and Microanalysis · 2006
Scientific ProgramMicroscopy and Microanalysis · 2008
Nanogenerators and NanopiezotronicsWang, ZL · Microscopy and Microanalysis · 2009
Trichomonads under MicroscopyBenchimol, Marlene · Microscopy and Microanalysis · 2004
Electron Microscopic Studies with GrapheneMeyer, J; Chuvilin, A; Kaiser, U · Microscopy and Microanalysis · 2009
Stress Whitening Morphology of Multiphase PolypropyleneWestphal, S · Microscopy and Microanalysis · 2006
Aberration-Corrected Lorentz MicroscopyNuhfer, NT; Budruk, A; De Graef, M · Microscopy and Microanalysis · 2010